Lot Acceptance Testing
Customer Specific SCD (Source Control Drawing)
RAD Radiation Testing
Upscreening of Components
Class "H" Testing-Military Level
Class "K" Testing-Unmanned Space Level
Class "S" Testing-Manned Space Level
DPA-Destructive Physical Analysis
SEM-Scanning Electron Microscopy
LVH-Low Voltage Humidity
Nondestructive Skock & Vibration
Wafer Processing
"Saw, Sort, Load"
Wafers Into Die Load
Die Into Specified Waffle Pack
Inspect To Applicable MIL-STD
Inspect To SCD (Source Control Drawing)
Packaged In Any Required Configuration Within Waffle Pack
Expedited Processing Available
ASIC Solutions
Custom Designed Semiconductors Or Passive Components Manufatctured To Your Precise SDC (Source Control Drawing)
Available For Commercial, Military, And Space level Applications
Benefits Include A Short Design Cycle, Miniaturized Components, Engineering R&D Assisatnce, and Fast Production Times
Protective Inventory Storage
Vacuum Seal Storage Method
Bare Die Products Stored In Their Waffle Packs In Aa 7-Mil, ESD Sensitive Dri-Shield 2700 Vacuum Sealed Moisture barrier Bag
Each bag Contains A MIL-STD Approved Clay Desiccant For Additonal Environmental Protection
Detailed Lot Traceability
ES Components Maintains Mfg Lot Numbers, Original Mfg Certificate of Compliance
Traceability & Lot Number Availablity Checks Avaialable Within
Seconds From Our Distribution Software System
Hard Copy Of Certificate Of Compliance Maintained On File For Reference
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